Proceedings : third IEEE International Workshop on Electronic Design, Test, and Applications, 17-19 January 2006, Kuala Lumpur, Malaysia

Author(s)

    • IEEE International Workshop on Electronic Design, Test and Applications
    • Girard, Patrick, Ph. D.
    • Osseiran, Adam
    • Chew, Moi-Tin

Bibliographic Information

Proceedings : third IEEE International Workshop on Electronic Design, Test, and Applications, 17-19 January 2006, Kuala Lumpur, Malaysia

edited by Patrick Girard, Adam Osseiran, and Moi-Tin Chew ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Malaysia Section, Monash University, Malaysia ; with industrial co-sponsorship from National Instruments ; in cooperation with Freescale Semiconductor Malaysia ... [et al.]

IEEE Computer Society, c2006

Other Title

DELTA 2006 : third IEEE International Workshop on Electronic Design, Test, and Applications : 17-19 January 2006, Kuala Lumpur, Malaysia

Third IEEE International Workshop on Electronic Design, Test, and Applications : DELTA 2006

International Workshop on Electronic Design, Test, and Applications

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"IEEE Computer Society Order Number P2500"--T.p. verso

Includes bibliographical references and index

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