2006 IEEE International Reliability Physics Symposium proceedings : 44th annual, San Jose, California, Marchl 26-30, 2006

著者

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c2006

大分大学学術情報拠点(図書館)

v. 1 : soft.621||IN9||2006-111329946, v. 2 : soft.621||IN9||2006-211329948

OPAC
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Includes bibliographical references

"IEEE catalog no. 06CH37728" -- T.p.