Proceedings : fourth IEEE International Symposium on Electronic Design, Test, and Applications, 23-25 January 2008, Hong Kong, SAR, China

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書誌事項

Proceedings : fourth IEEE International Symposium on Electronic Design, Test, and Applications, 23-25 January 2008, Hong Kong, SAR, China

editors, Adam Osseiran ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Hong Kong ED/SSC Joint Chapter, Hong Kong University of Science and Technology

IEEE Computer Society, c2008

タイトル別名

Fourth IEEE International Workshop on Electronic Design, Test, and Applications

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注記

Includes bibliographical references and index

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