Handbook of nanoscopy

著者

• Tendeloo, G. Van (Gustaaf)
• Van Dyck, Dirk
• Pennycook, Stephen J.

書誌事項

Handbook of nanoscopy

edited by Gustaaf van Tendeloo, Dirk van Dyck, and Stephen J. Pennycook

Wiley-VCH, c2012

• : set
• v.1
• v.2

注記

Includes bibliographical references and index

内容説明・目次

内容説明

This completely revised successor to the Handbook of Microscopy supplies in-depth coverage of all imaging technologies from the optical to the electron and scanning techniques. Adopting a twofold approach, the book firstly presents the various technologies as such, before going on to cover the materials class by class, analyzing how the different imaging methods can be successfully applied. It covers the latest developments in techniques, such as in-situ TEM, 3D imaging in TEM and SEM, as well as a broad range of material types, including metals, alloys, ceramics, polymers, semiconductors, minerals, quasicrystals, amorphous solids, among others. The volumes are divided between methods and applications, making this both a reliable reference and handbook for chemists, physicists, biologists, materials scientists and engineers, as well as graduate students and their lecturers.

目次

General Introduction From the Past to the Future VOLUME I: Methods LIGHT MICROSCOPY Fundamentals of Light Microscopy Optical Contrasting of Microstructures Near-Field Optical Microscopy X-RAY MICROSCOPY Soft X-Ray Imaging X-Ray Microtomography and X-Ray Topography MAGNETIC MICROSCOPY NMR Imaging FIELD ION MICROSCOPY Field Emission and Field Ion Microscopy SCANNING POINT PROBE TECHNIQUES Scanning Probe Microscopy Atomic Force Microscopy ELECTRON MICROSCOPY: STATIONARY BEAM METHODS Transmission Electron Microscopy (TEM) High-Resolution TEM Aberration-Corrected High Resolution Microscopy Electron Energy Loss Spectroscopy Imaging Low Energy Electron Microscopy Lorentz Microscopy Electron Holography Methods Electron Tomography In-Situ TEM Nanolab Dynamic TEM SCANNING BEAM METHODS Scanning Electron Microscopy and Scanning Ion Microscopy Focused Ion Beam Microscopy Scanning Transmission Electron Microscopy: Z Contrast Composition Mapping Imaging Secondary Ion Mass Spectroscopy IMAGE RECORDING, HANDLING AND PROCESSING Image Recording in Microscopy Image Processing Statistical Parameter Estimation VOLUME 2: Applications Metals and Alloys Minerals and Geological Materials Ferroic Materials Grain Boundaries and Structural Ceramics Non-Periodic Structures and Amorphous Materials Quasi-Crystalline Materials Carbon Polymers and Monomeric Analogs Magnetic Materials Small Particles Preparation Techniques for Transmission Electron Microscopy Catalytic Materials and Porous Materials Nanowires and Nanotubes Biomaterials Complex Oxides Energy Materials Surfaces and Interfaces Polymers Semiconductors and Semiconducting Devices Optoelectronic and Spintronics Materials

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詳細情報

• NII書誌ID(NCID): BB09047387
• ISBN:
  • 9783527317066
• 出版国コード: gw
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Weinheim
• ページ数/冊数: 2 v.
• 大きさ: 25 cm
• 分類:
  • DC23 : 502.82
• 件名:
  • LCSH : Microscopy
  • LCSH : Nanotechnology