Three-dimensional imaging, optical metrology, and inspection IV : 2-3 November, 1998, Boston, Massachusetts

著者

書誌事項

Three-dimensional imaging, optical metrology, and inspection IV : 2-3 November, 1998, Boston, Massachusetts

Kevin G. Harding, ... [et al.], chairs/editors ; sponsored by, SPIE--the International Society for Optical Engineering ; endorsed by SME--the Society of Manufacturing Engineers

（Proceedings / SPIE -- the International Society for Optical Engineering, v. 3520）

SPIE, c1998

タイトル別名

Three dimensional imaging, optical metrology, and inspection 4

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注記

Includes bibliographic references and author index

内容説明・目次

内容説明

Topics in this volume include: structured light methods; rangefinding methods; and micromeasurements.

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    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

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