Nakajima Koichi

ID:9000253022956

Toyota Central Research & Development Laboratories Inc. (1975年 CiNii収録論文より)

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  • Quantitative Electron Probe Microanalysis of Thin Films

    Oda Yuzo , Nakajima Koichi

    A new method for analysis of thin films by electron microprobe technique is proposed. This method is characterized by the determination of the thickness of thin films together with its chemical compos …

    Transactions of the Japan Institute of Metals 16(11), 697-701, 1975

    DOI

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