Eguchi T.

ID:9000253024370

Department of Materials Science and Technology, Graduate School of Engineering Science, Kyushu University (1981年 CiNii収録論文より)

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  • Critical Voltage Effect in Cu-based Alloys Containing Al or Au

    Kuroda K. , Tomokiyo Y. , Eguchi T.

    The critical voltage <I>V</I><SUB>c</SUB> of Cu-based alloys with 15 at%Al and 5 or 15 at%Au were measured by JEM-1000 HVEM to study the effect of composition, temperature and …

    Transactions of the Japan Institute of Metals 22(8), 535-542, 1981

    DOI

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