Kanaya Koichi

ID:9000253024759

Department of Electrical Engineering, Kogakuin University (1983年 CiNii収録論文より)

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  • Lattice Image Observations of Defects in CdS and CdSe

    Suzuki Kunio , Takeuchi Shin , Shino Masayuki , Kanaya Koichi , Iwanaga Hiroshi

    Atomic configurations of various lattice defects, dislocations and stacking faults introduced by plastic deformation and ion bombardment, were investigated by high resolution electron microscopy for C …

    Transactions of the Japan Institute of Metals 24(6), 435-442, 1983

    DOI

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