YAMAMOTO Hiroshi

ID:9000300213716

Center for Natural Sciences, Kitasato University (2015年 CiNii収録論文より)

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  • Millimeter-Wave Ellipsometry Using Interface-Planarization Prism

    YAMAMOTO Hiroshi , ITO Hiroshi

    The use of an interface-planarization (IP) prism in millimeter-wave ellipsometry is proposed to achieve reproducible measurements of soft, protean, and non-flat samples. The complex relative dielectri …

    IEICE Transactions on Electronics E98.C(8), 873-877, 2015

    J-STAGE

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