Han Xing

ID:9000303162487

School of Microelectronics, Shanghai Jiao Tong University (2015年 CiNii収録論文より)

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  • A PGM based multi-level reliability analysis method for Data Cache

    Jiao Jiajia , Han Xing , Fu Yuzhuo

    With scaling technology node, soft error has dominated in the integrated circuit failure. To tradeoff the design cost and reliability, efficient reliability analysis methods are required to select the …

    IEICE Electronics Express 12(16), 20150453-20150453, 2015

    J-STAGE

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