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表紙
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目次
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Diagnosis for Open Faults Based on Detecting/Un-detecting Information on Tests
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1-6
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Diagnosis for Single/Multiple Stuck-at Faults by Ambiguous Diagnostic Test Set
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7-12
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The Relationship Between the Test Properties and the Fault Models in Diagnosis of Single Bridging Faults by Using Pass/Fail Information
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13-17
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Analog LSI Relation Among Measurement Accuracy, Yield, and Test Time
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19-22
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Proposal of Low Power Board-Type Reconfigurable Tester
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23-28
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Dataflow Oriented Template Generation for Instruction-Based Self-Test of Processor Cores
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29-34
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Input Temporal Spatial Constraint of Controller for Instruction-Based Self-Testing of Processor Cores
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35-40
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A Test Vector Ordering for Overhead Reduction of Test Decompressors
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41-46
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Random Access Scan : A solution to test power, test data volume and test time
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47-53
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Power-Conscious Area and Time Co-Optimization for System-on-a-Chip based on Consecutive Testability
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55-60
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A DFT Selection Method for Reducing Test Application Time of System-on-Chips
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61-66
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Classification of Sequential Circuits Based on Combinational Test Generation Complexity
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67-72
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Majority Voting by Partial Retries
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73-78
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複写される方へ
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奥付
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