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表紙
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目次
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A methodology of generating verification scenarios from specification
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1-4
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Equivalence Checking using a Decidable Subclass of First-Order-Logic under Equivalence Constraints
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5-10
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Bounded Model Checking for Assertions including Dynamic Local Variables
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11-16
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Formal Verification Method for Arithmetic Circuits and Its Evaluation
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17-22
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A Method of Test Plan Generation in Hierarchical Test Based on Balanced Structure
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23-28
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Test Compression/Decompression with the Decoding Function in Multimedia Cores
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29-34
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Test relaxation for N-detection test patterns in broad-side delay testing
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35-40
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Decision Diagram Data Structure to Represent Quantum Circuit
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41-46
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Depth-Optimum and Area-Optimal Technology Mapping for LUT-based FPGAs
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47-52
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Asymmetric Slope Differential Logic with High-Speed and Low-Power Operation Modes
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53-58
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Test Scheduling for SoGs with Built-In Self-Repairable Memory Cores
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59-64
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A Self-Test of Dynamically Reconfigurable Processors
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65-70
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Proposal of a Behavioral Synthesis Method for Asynchronous Circuits in Budled-data Implementation
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71-76
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A Basic Study on Datapath Synthesis Considering Delay Variation
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77-82
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Computational Complexity of Simultaneous Optimization of Control Schedule and Skew in Datapath Synthesis
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83-88
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複写される方へ
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Notice about photocopying
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奥付
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