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表紙
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目次
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NoC Wrapper Optimization under Channel Bandwidth and Test Time Constraints
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1-6
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Improving Availability on a Muti-server Operating System
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7-11
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Efficiency of compiled-code method in fault simulation for sequential circuits
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13-18
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A Study on Test Generation for Fault Diagnosis Based on Justification Path
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19-23
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On generation of high-quality test patterns for transition faults
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25-30
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Test Generation for Transistor Shorts based on Gate-level
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31-36
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Analysis of Effective Decision Nodes on Test Generation
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37-42
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Reduction in Over-Testing of Delay Faults through False Paths Identification Using RTL Information
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43-48
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An Extended Class of Sequential Circuits with Acyclical Testability
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49-54
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Implementation of a Double Clock Pulse Method and Evaluation of Tolerance for Process Variations
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55-60
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Fault Diagnosis of Analog Circuit by Adaptive Test of Digital Circuit
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61-66
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複写される方へ
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奥付
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