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表紙
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目次
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Stuck-at Test Data Compression using Scan FFs with Delay Fault Testability
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1-6
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A Transition Delay Test Generation Method for Capture Power Reduction during At-Speed Scan Testing
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7-12
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An Optimization of Thru Trees for Test Generation Based on Acyclical Testability
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13-18
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An Approximate Invariant Property Checking Using Term-Height Reduction for a Subset of First-Order Logic
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19-24
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A Memory Management Technique for Energy Reduction in Multi-Task Embedded Applications
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25-29
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An ILP Model of Code Placement Problem for Minimizing the Energy Consumption in Embedded Processors
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31-36
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A process-variation-aware low-power technique using current control
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37-42
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Proposal of domino-RSL circuit which is resistant to Differential Power Analysis attack on cryptographic circuit
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43-48
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Comparison of Standard Cell based Non-linear Asynchronous Pipelines
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49-54
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An On-Chip Bus Architecture for Post-Fabrication Timing Calibration
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55-60
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Proposal and Circuit Performance Evaluation of Mask-less Via Programmable Device VPEX for EB Direct Writing
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61-66
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Initial Evaluation of FIR Filter Based on Digit-Serial Computation
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67-72
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複写される方へ
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Notice for Photocopying
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奥付
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