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表紙
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目次
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ESD/Latch up Failure Analysis of CMOS LSI : Failure Mode Analysis with Actual Data
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1-5
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Fault Diagnosis for Dynamic Open Faults with Considering Adjacent Lines
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7-12
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Diagnostic Test Generation for Transition Faults
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13-18
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A Test Generation for Full Scan Circuit Using Multi Cycle Capture Test
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19-24
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A variable n-detection test generation method to increase fault sensitization coverage and evaluation of its test quality
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25-31
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Note on Test Power Reduction for Scan-Based Hybrid BIST
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33-38
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Secure Scan Design Based on Balanced Structure
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39-44
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Fault Secure Property for Soft Error on FPGA Using Two-Rail Logic
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45-50
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Synthesis of Fault Secure Datapaths with DFG Restructuring
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51-56
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An evaluation of encryption LSI testability against scan based attack
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57-62
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RTL False Path Identification Using High Level Synthesis Information
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63-68
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A Test Generation Method for State Observable FSMs to Increase Defect Coverage Under Test Length Constraint
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69-76
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Comparison of exact solutions and greedy solutions in static test compaction
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77-82
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Current dissipation of Test pattern generators using ATPG vectors
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83-88
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Note on Testing of RF Transmitter Considering Component Variation
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89-94
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Fault Diagnosis of Analog Circuits by Using Multiple Transistors and Data Samplings
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95-100
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A Self-Correction Method for Periodic Signals
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101-106
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複写される方へ
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Notice for Photocopying
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奥付
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