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表紙
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目次
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Design method of easily testable parallel prefix adders
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1-6
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Note on Yield and Area Trade-offs for MBIST in SoC
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7-12
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A Test Generation Algorithm Based on 5-valued Logic for Threshold Testing
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13-18
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Diagnostic Test Generation for Transition Faults Using a Stuck-at ATPG Tool
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19-24
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High-level Design for Test Tools & Industrial Design Flows
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25-28
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Power & Noise Aware Test Utilizing Preliminary Estimation
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29-30
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An Area Reduction Technique of Self-testing FFs for Small-delay Defects Detection
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31-34
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Case study: Fault diagnosis for detecting systematic fault
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35
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複写される方へ
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Notice for photocopying
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奥付
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