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表紙
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目次
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Built-In Test for Logic Circuits with Multiple Clocks
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1-8
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A New Method for Test Cost Reduction using ATG and BIST Techniques
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9-15
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A Note on Partially Rotational Scan Design for Processor Circuits
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17-22
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Fault-Tolerant Design of Competitive Larning Type Neural Networks by the Duplication of the Search for the Minimum Circuits
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23-28
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Analyzing Failure Traces for Verification of GasP Circuits
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29-36
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Internally balanced structure with hold and switching functions
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37-44
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A DFT Method with Embedded Test Plans for RTL Circuits
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45-52
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A Method of Partially Enhanced Scan Design for Path Delay Faults Based on Discontinuous Reconvergence Structure
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53-60
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Design for Two-Pattern Testability of Controller-Data Path Circuits
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61-67
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A Method of Test Generation for Path Delay Faults Using Stuck-at Fault Test Generation Algorithms
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69-75
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A Method to Identity Target Crosstalk-induced Delay Faults in Sequential Circuits
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77-84
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Evaluation of Path Selection Criteria and Test Quality for Delay Testing
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85-91
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[OTHERS]
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裏表紙
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