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Williams, P. (Peter)

ID:DA02600563

Alias Name: Williams, Peter

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1

Applied materials characterization : symposium held April 15-18, 1985, San Francisco, California, U.S.A.

editors, W. Katz, P. Williams

Materials Research Society c1985 Materials Research Society symposium proceedings v. 48

Available at 10 libraries
2

Ion beam analysis 6 : proceedings of the Sixth International Conference on Ion Beam Analysis, Tempe, Arizona, May 23-27, 1983

editors, W. A. Lanford, I.S. T. Tsong, P. Williams

North-Holland 1983

Available at 1 libraries

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