Granger, Edward M.

ID:DA03410326

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  • Metrology of optoelectronic systems : 21-22 May 1987, Orlando, Florida

    Edward M. Granger, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Center for Applied Optics/University of Alabama in Huntsville ... [et al.]

    SPIE c1987 Proceedings / SPIE -- the International Society for Optical Engineering v. 776

    : pbk

    所蔵館3館

  • Image quality, an overview : April 9-10, 1985, Arlington, Virginia

    Edward M. Granger, Lionel R. Baker, chairmen/editors ; cosponsored by Sira Ltd

    SPIE--the International Society for Optical Engineering c1985 Proceedings / SPIE -- the International Society for Optical Engineering v. 549

    pbk.

    所蔵館4館

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