{"@context":{"dc":"http://purl.org/dc/elements/1.1/","foaf":"http://xmlns.com/foaf/0.1/","dcterms":"http://purl.org/dc/terms/","owl":"http://www.w3.org/2002/07/owl#","rdfs":"http://www.w3.org/2000/01/rdf-schema#","cinii":"http://ci.nii.ac.jp/ns/1.0/"},"@id":"https://ci.nii.ac.jp/author/DA03850373.json","@graph":[{"@id":"https://ci.nii.ac.jp/author/DA03850373#entity","@type":"foaf:Group","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/author/DA03850373.json"},"foaf:name":[{"@value":"IEEE Semiconductor Thermal and Temperature Measurement Symposium"}],"cinii:authorid":"DA03850373","dcterms:alternative":["Semiconductor Thermal and Temperature Measurement Symposium, IEEE","SEMI-THERM"],"rdfs:seeAlso":[{"@id":"https://viaf.org/viaf/NII%7CDA03850373","dc:title":"VIAF"},{"@id":"https://nrid.nii.ac.jp/search/?qg=IEEE%2BSemiconductor%2BThermal%2Band%2BTemperature%2BMeasurement%2BSymposium","dc:title":"KAKEN — Researchers"},{"@id":"https://jglobal.jst.go.jp/search/researchers#%7B%22category%22%3A%221%22%2C%22keyword%22%3A%22IEEE%20Semiconductor%20Thermal%20and%20Temperature%20Measurement%20Symposium%22%7D","dc:title":"J-GLOBAL"},{"@id":"https://researchmap.jp/researchers?name=IEEE+Semiconductor+Thermal+and+Temperature+Measurement+Symposium","dc:title":"researchmap"},{"@id":"https://scholar.google.co.jp/scholar?q=IEEE+Semiconductor+Thermal+and+Temperature+Measurement+Symposium&hl=ja&btnG=%E6%A4%9C%E7%B4%A2&lr=","dc:title":"Google Scholar"},{"@id":"https://www.google.co.jp/search?hl=ja&q=IEEE+Semiconductor+Thermal+and+Temperature+Measurement+Symposium&btnG=%E6%A4%9C%E7%B4%A2&lr=","dc:title":"Google"},{"@id":"https://search.yahoo.co.jp/search?p=IEEE+Semiconductor+Thermal+and+Temperature+Measurement+Symposium&search.x=1&fr=top_ga1_sa&tid=top_ga1_sa&ei=UTF-8&aq=&oq=","dc:title":"Yahoo! JAPAN"}]}]}