Bhattacharya, Debashis

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Debashis Bhattacharya

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  • Hierarchical modeling for VLSI circuit testing

    by Debashis Bhattacharya, John P. Hayes

    Kluwer Academic Publishers c1990 The Kluwer international series in engineering and computer science VLSI, computer architecture, and digital signal processing

    Available at 12 libraries

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