Butler, Kenneth M.

検索結果1件中 1-1 を表示

  • Assessing fault model and test quality

    by Kenneth M. Butler and M. Ray Mercer

    Kluwer Academic c1992 The Kluwer international series in engineering and computer science SECS 157 . VLSI, computer architecture, and digital signal processing

    所蔵館12館

ページトップへ