{"@context":{"dc":"http://purl.org/dc/elements/1.1/","foaf":"http://xmlns.com/foaf/0.1/","dcterms":"http://purl.org/dc/terms/","owl":"http://www.w3.org/2002/07/owl#","rdfs":"http://www.w3.org/2000/01/rdf-schema#","cinii":"http://ci.nii.ac.jp/ns/1.0/"},"@id":"https://ci.nii.ac.jp/author/DA0747652X.json","@graph":[{"@id":"https://ci.nii.ac.jp/author/DA0747652X#entity","@type":"foaf:Organization","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/author/DA0747652X.json"},"foaf:name":[{"@value":"American Society for Testing and Materials. Committee F-1 on Materials for Electron Devices and Microelectronics"}],"cinii:authorid":"DA0747652X","dcterms:alternative":["ASTM Committee F-1 on Materials for Electron Tubes and Semiconductor Devices"],"owl:sameAs":[{"dc:title":"American Society for Testing Materials. Committee F-1 on Materials for Electron Tubes and Semiconductor Devices"},{"dc:title":"ASTM Committee F-1 on Electronics"}],"rdfs:seeAlso":[{"@id":"https://viaf.org/viaf/NII%7CDA0747652X","dc:title":"VIAF"},{"@id":"https://nrid.nii.ac.jp/search/?qg=American%2BSociety%2Bfor%2BTesting%2Band%2BMaterials.%2BCommittee%2BF-1%2Bon%2BMaterials%2Bfor%2BElectron%2BDevices%2Band%2BMicroelectronics","dc:title":"KAKEN — Researchers"},{"@id":"https://jglobal.jst.go.jp/search/researchers#%7B%22category%22%3A%221%22%2C%22keyword%22%3A%22American%20Society%20for%20Testing%20and%20Materials.%20Committee%20F-1%20on%20Materials%20for%20Electron%20Devices%20and%20Microelectronics%22%7D","dc:title":"J-GLOBAL"},{"@id":"https://researchmap.jp/researchers?name=American+Society+for+Testing+and+Materials.+Committee+F-1+on+Materials+for+Electron+Devices+and+Microelectronics","dc:title":"researchmap"},{"@id":"https://scholar.google.co.jp/scholar?q=American+Society+for+Testing+and+Materials.+Committee+F-1+on+Materials+for+Electron+Devices+and+Microelectronics&hl=ja&btnG=%E6%A4%9C%E7%B4%A2&lr=","dc:title":"Google Scholar"},{"@id":"https://www.google.co.jp/search?hl=ja&q=American+Society+for+Testing+and+Materials.+Committee+F-1+on+Materials+for+Electron+Devices+and+Microelectronics&btnG=%E6%A4%9C%E7%B4%A2&lr=","dc:title":"Google"},{"@id":"https://search.yahoo.co.jp/search?p=American+Society+for+Testing+and+Materials.+Committee+F-1+on+Materials+for+Electron+Devices+and+Microelectronics&search.x=1&fr=top_ga1_sa&tid=top_ga1_sa&ei=UTF-8&aq=&oq=","dc:title":"Yahoo! JAPAN"}]}]}