ID:DA12300318
International Workshop on Memory Technology, Design, and Testing, IEEE
Workshop on Memory Technology, Design, and Testing, IEEE International
International Workshop on Memory Technology, Design, and Testing
MTDT
IEEE International Workshop on Memory Testing (1993 : San Jose, Calif.)
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IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua University
IEEE Computer Society c2005
所蔵館1館
edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society
IEEE Computer Society c2004
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid State Circuits Society ; [edited by Tom Wik, Adit Singh, and Rochit Rajsuman]
IEEE Computer Society c2003
所蔵館2館
editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society
IEEE Computer Society c2002
: bookbroker
editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Society
IEEE Computer Society c2001
: case
edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid State Circuits Society
Institute of Electrical and Electronics Engieers c2000
:case.
edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid-State Circuits Society
Institute of Electrical and Electronics Engieers c1999
sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]
IEEE Computer Society Press c1998
edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council
IEEE Computer Society Press c1997