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Jeff W. Eerkens
Springer c2010 2nd ed Topics in safety, risk, reliability and quality 16
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by Jeff W. Eerkens
Springer c2006 Topics in safety, risk, reliability and quality v. 11
: hb
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Jeff W. Eerkens, editor
SPIE Optical Engineering Press c1995 SPIE milestone series v. MS 113
alk. paper
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