ID:DA13015113
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Jeff W. Eerkens
Springer c2010 2nd ed Topics in safety, risk, reliability and quality 16
Available at 4 libraries
by Jeff W. Eerkens
Springer c2006 Topics in safety, risk, reliability and quality v. 11
: hb
Available at 3 libraries
Jeff W. Eerkens, editor
SPIE Optical Engineering Press c1995 SPIE milestone series v. MS 113
alk. paper
Available at 2 libraries
