ID:DA16270616
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editors, Adam Osseiran ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Hong Kong ED/SSC Joint Chapter, Hong Kong University of Science and Technology
IEEE Computer Society c2008
edited by Ricardo Reis, Adam Osseiran, Hans-Joerg Pfleiderer
Springer c2007 The International Federation for Information Processing 240
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