Osseiran, Adam

ID:DA16270616

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Proceedings : fourth IEEE International Symposium on Electronic Design, Test, and Applications, 23-25 January 2008, Hong Kong, SAR, China

editors, Adam Osseiran ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Hong Kong ED/SSC Joint Chapter, Hong Kong University of Science and Technology

IEEE Computer Society c2008
2

VLSI-SoC: From Systems to Silicon : proceedings of IFIP TC 10, WG 10.5, Thirteenth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2005), October 17-19, 2005, Perth, Australia

edited by Ricardo Reis, Adam Osseiran, Hans-Joerg Pfleiderer

Springer c2007 The International Federation for Information Processing 240

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