検索結果142件中 1-20 を表示

  • GOHSHI Yohichi ID: 9000000086488

    Department of Applied Chemistry Faculty of Engineering The University of Tokyo (1995年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Preface (1995)
  • GOHSHI Yohichi ID: 9000005598512

    Department of Applied Chemistry, School of Engineering, The University of Tokyo (1999年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Electron Spectroscopy Using a Gas-Flow Proportional Counter under Gaseous Environment and its Application to X-Ray absorption fine structure Measurements (1999)
  • GOHSHI Yohichi ID: 9000005715726

    Faculry of Engineering, University of Tokyo (1994年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Cu 2p Photoelectron and 2p_<3/2>-Valence-Valence Auger Electron Spectra of Cuprate Superconductors (1994)
  • GOHSHI Yohichi ID: 9000005751768

    Institute of Industrial Science, University of Tokyo (1978年 CiNii収録論文より)

    CiNii収録論文: 2件

    • Angular Denendence of XPS Intensities from GaAs (110) Surface : PHOTOEMISSION (MAINLY UPS AND XPS) (1978)
    • Chemical State Analysis of Silicon-Oxygen Compounds : CHEMICAL APPLICATIONS (1978)
  • GOHSHI Yohichi ID: 9000005751928

    Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo (1978年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Data Processing in High Resolution X-Ray Spectroscopy : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION (1978)
  • GOHSHI Yohichi ID: 9000020090543

    Department of Industrial Chemistry, University of Tokyo (1993年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Surface Sensitive X-ray Absorption Fine Structure Measurement Using Sample Current Induced by Totally Reflected X-rays. (1993)
  • GOHSHI Yohichi ID: 9000020463229

    Department of Industrial Chemistry, Faculty of Engineering, Hitoshi University of Tokyo (1980年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Fine structures in sulfur and iron X-ray emission spectra. (1980)
  • GOHSHI Yohichi ID: 9000020801057

    CiNii収録論文: 1件

    • Estimation of minimum detection limit in synchrotron radiation X-ray fluorescence analysis. (1984)
  • Gohshi Yohichi ID: 9000021766359

    Department of Industrial Chemistry, Faculty of Engineering, The University of Tokyo (1989年 CiNii収録論文より)

    CiNii収録論文: 1件

    • A simple and rugged home-build scanning tunneling microscope for operation in both air and liquid. (1989)
  • Gohshi Yohichi ID: 9000021784952

    Department of Industrial Chemistry, Faculty of Engineering, The University of Tokyo (1989年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Aggregation of complexes coordinated with N,N'-bis(5-alkylsalicylidene)ethylenediamine: 1H NMR peak shifts and paramagnetic broadening investigations. (1989)
  • GOHSHI Yohichi ID: 9000022045092

    Research and Development Center, Toshiba Corporation|Department of Industrial Chemistry, University of Tokyo (1978年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Method for determining degassing constant of xenon in liquid sodium. (1978)
  • GOHSHI Yohichi ID: 9000022045260

    Tokyo Shibaura Electric Co., Ltd. (1977年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Cold trapping of fission products in a stainless steel sodium loop. (1977)
  • Gohshi Yohichi ID: 9000023695507

    CiNii収録論文: 1件

    • Many‐body effects in x‐ray photoemission and high‐Tc superconductivity of cuprate superconductors (1993)
  • Gohshi Yohichi ID: 9000023695598

    CiNii収録論文: 1件

    • Creation of Strong Pinning Sites by X-Ray-Irradiation for Gd1Ba2Cu3O7-x Superconducting Thin-Films (1990)
  • Gohshi Yohichi ID: 9000023815709

    CiNii収録論文: 1件

    • X-Ray-Fluorescence Spectroscopy of Cu-In-Se Chalcopyrite-Structure Thin-Films (1992)
  • Gohshi Yohichi ID: 9000252757037

    CiNii収録論文: 1件

    • Deconvolution of Iron Kβ<SUB>1,3</SUB> Spectra Fitted with Spline Functions (1981)
  • Gohshi Yohichi ID: 9000252758985

    Department of Industrial Chemistry, Faculty of Engineering, The University of Tokyo (1985年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Photothermal Beam Deflection (PBD) Image of Certain GaAs Wafers (1985)
  • Gohshi Yohichi ID: 9000252760358

    Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo (1987年 CiNii収録論文より)

    CiNii収録論文: 1件

    • A Scanning X-Ray Fluorescence Microprobe with Synchrotron Radiation (1987)
  • Gohshi Yohichi ID: 9000252761075

    Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo (1988年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Chemical State Mapping by X-Ray Fluorescence Using Absorption Edge Shifts (1988)
  • Gohshi Yohichi ID: 9000252764844

    Department of Industrial Chemistry, Faculty of Engineering, The University of Tokyo (1992年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Barrier Height Imaging Investigation of Liquid Crystal Molecules Adsorbed on Graphite (1992)
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