検索結果55件中 1-20 を表示

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  • KAMEI Masayuki ID: 9000002175975

    Graduate School of Engineering, Kyoto University (2007年 CiNii収録論文より)

    CiNii収録論文: 2件

    • Quantitative Characterization of Plasma-Induced Defect Generation Process in Exposed Thin Si Surface Layers (2007)
    • A Comparative Study of Plasma Source-Dependent Charging Polarity in MOSFETs with High-k and SiO_2 Gate Dielectrics (2007)
  • Kamei Masayuki ID: 9000077948309

    CiNii収録論文: 1件

    • Quantitative Characterization of Plasma-Induced Defect Generation Process in Exposed Thin Si Surface Layers (2008)
  • KAMEI Masayuki ID: 9000107336405

    Advanced Materials Laboratory (AML), National Institute for Materials Science (NIMS) (2004年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Photocatalytic Property and Deep Levels of Nb-doped Anatase TiO_2 Film Grown by Metalorganic Chemical Vapor Depostion (2004)
  • Kamei Masayuki ID: 9000252978440

    Superconductivity Resarch Laboratory, ISTEC (1991年 CiNii収録論文より)

    CiNii収録論文: 1件

    • X-Ray Chemical Analysis of an YBa<SUB>2</SUB>Cu<SUB>3</SUB>O<I><SUB>x</SUB></I> Thin Film by Scanning Electron Microscopy and Total-Reflection-Angle X-Ray Spectroscopy (SEM-TRAXS) (1991)
  • Kamei Masayuki ID: 9000252980110

    Superconductivity Resarch Laboratory, ISTEC (1991年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Novel Chemical Analysis for Thin Films: Scanning Electron Microscopy & Total-Reflection-Angle X-Ray Spectroscopy (SEM-TRAXS)—X-Ray Take-Off Angle Effect (1991)
  • Kamei Masayuki ID: 9000252981660

    Superconductivity Research Laboratory, ISTEC (1992年 CiNii収録論文より)

    CiNii収録論文: 1件

    • <I>In Situ</I> X-Ray Chemical Analysis of Y<SUB>1</SUB>Ba<SUB>2</SUB>Cu<SUB>3</SUB>O<SUB>7−<I>x</I></SUB> Films by Reflection-High-Energy-Electron-Diffraction Total-Reflection-Angle X-Ray Spectroscopy (1992)
  • Kamei Masayuki ID: 9000258130956

    Department of Materials Science and Technology, Science University of Tokyo, Noda, Chiba 278, Japan (1996年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Adsorption Site Determination by Reflection High-Energy Electron Diffraction Combined with Interface Energy Calculation. (1996)
  • Kamei Masayuki ID: 9000258139451

    Institute of Industrial Science, University of Tokyo, 7–22–1 Roppongi, Minato–ku, Tokyo 106–8558, Japan (1998年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Effect of Sn Doping on the Crystal Growth of Indium Oxide Films. (1998)
  • Kamei Masayuki ID: 9000258144716

    Institute of Industrial Science, University of Tokyo, 7–22–1 Roppongi, Minato–ku, Tokyo, Japan (1999年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Influence of Unbalanced Magnetron and Penning Ionization for RF Reactive Magnetron Sputtering. (1999)
  • Kamei Masayuki ID: 9000283201053

    Department of Polymer Engineering, Tokyo Institute of Technology (1971年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Microstructure of Poly(methyl propenyl ether) (1971)
  • KAMEI Masayuki ID: 9000391846294

    National Institute for Materials Scinece, JAPAN (2003年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Synthesis and Characterization of Single Junction Low Voltage Varistors Composed of ZnO Single Crystals and Novel Intafacial Glass Phase (2003)
  • Kamei Masayuki ID: 9000392729163

    CiNii収録論文: 1件

    • X-Ray Chemical Analysis of an YBa<SUB>2</SUB>Cu<SUB>3</SUB>O<I><SUB>x</SUB></I> Thin Film by Scanning Electron Microscopy and Total-Reflection-Angle X-Ray Spectroscopy (SEM-TRAXS) (1991)
  • Kamei Masayuki ID: 9000392729994

    CiNii収録論文: 1件

    • <I>In Situ</I> X-Ray Chemical Analysis of Y<SUB>1</SUB>Ba<SUB>2</SUB>Cu<SUB>3</SUB>O<SUB>7−<I>x</I></SUB> Films by Reflection-High-Energy-Electron-Diffraction Total-Reflection-Angle X-Ray Spectroscopy (1992)
  • Kamei Masayuki ID: 9000392731066

    CiNii収録論文: 1件

    • Novel Chemical Analysis for Thin Films: Scanning Electron Microscopy & Total-Reflection-Angle X-Ray Spectroscopy (SEM-TRAXS)—X-Ray Take-Off Angle Effect (1991)
  • Kamei Masayuki ID: 9000401565283

    CiNii収録論文: 1件

    • Localization of the Photocatalytic Reaction on the Grain Boundary of Bicrystalline TiO2 (2008)
  • Kamei Masayuki ID: 9000401625659

    CiNii収録論文: 1件

    • Novel Chemical Analysis for Thin Films: Scanning Electron Microscopy & Total-Reflection-Angle X-Ray Spectroscopy (SEM-TRAXS)-X-Ray Take-Off Angle Effect (1991)
  • Kamei Masayuki ID: 9000401626121

    CiNii収録論文: 1件

    • X-Ray Chemical Analysis of an YBa2Cu3OxThin Film by Scanning Electron Microscopy and Total-Reflection-Angle X-Ray Spectroscopy (SEM-TRAXS) (1991)
  • Kamei Masayuki ID: 9000401627582

    CiNii収録論文: 1件

    • In SituX-Ray Chemical Analysis of Y1Ba2Cu3O7-xFilms by Reflection-High-Energy-Electron-Diffraction Total-Reflection-Angle X-Ray Spectroscopy (1992)
  • Kamei Masayuki ID: 9000401651600

    CiNii収録論文: 1件

    • Two Dimensional Structure and Growth Mode of Ultrathin Ce Film on a Mo(110) Surface (1995)
  • Kamei Masayuki ID: 9000401661114

    CiNii収録論文: 1件

    • Adsorption Site Determination by Reflection High-Energy Electron Diffraction Combined with Interface Energy Calculation (1996)
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