検索結果215件中 1-20 を表示

  • 重川 秀実 ID: 9000404507782

    筑波大学物理工学系,21世紀COE,NANOプロジェクト (2004年 CiNii収録論文より)

    CiNii収録論文: 1件

    • 光STM-超高速時間応答測定の可能性 (2004)
  • SHIGEKAWA Hidemi ID: 9000005720619

    CiNii収録論文: 1件

    • FOREWORD (<Special Issue> Scanning Tunneling Microscopy) (1997)
  • SHIGEKAWA Hidemi ID: 9000005754894

    Department of Applied Physics, The University of Tokyo (1986年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Two-Process Model for a Comprehensive Interpretation of Photostimulated Exoelectron Emission (1986)
  • Shigekawa Hidemi ID: 9000018710883

    Institute of Applied Physics, University of Tsukuba (2011年 CiNii収録論文より)

    CiNii収録論文: 1件

    • 28aTG-5 Nanoscale spectroscopy by optical pump-probe STM(Nanoscience by the fusion of light and scanning probe microscopy) (2011)
  • Shigekawa Hidemi ID: 9000057481058

    CiNii収録論文: 1件

    • Kelvin Probe Force Microscopy without Bias-Voltage Feedback (2007)
  • Shigekawa Hidemi ID: 9000082018936

    CiNii収録論文: 1件

    • Scanning Tunneling Microscopy and Spectroscopy Studies of Glycine on Cu(100): Inelastic-Tunneling Manipulation of Single Glycine Molecule (2008)
  • SHIGEKAWA Hidemi ID: 9000107307056

    Institute of Applied Physics, 21st Century COE, University of Tsukuba (2003年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Structures of Self-Assembled Monolayer of Molecules Adsorbed on Highly Oriented Pyrolytic Graphite and Au(111) Substrates (2003)
  • SHIGEKAWA Hidemi ID: 9000107341014

    Institute of Applied Physics, 21th Century COE, NANO project, University of Tsukuba (2004年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Characteristic of the Si(100) Surface Low-Temperature Phase with Two Competing Structures Investigated by Rare Gas Adsorption (2004)
  • SHIGEKAWA Hidemi ID: 9000107374793

    Institute of Applied Physics, 21st Century COE, CREST JST, University of Tsukuba (2005年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Analysis of Time-Resolved Tunnel Current Signal in Sub-Picosecond Range Observed by Shaken-Pulse-Pair-Excited Scanning Tunneling Miscroscopy (2005)
  • SHIGEKAWA Hidemi ID: 9000107374928

    Institute of Applied Physics, University of Tsukuba, 21st COE, CREST-JST (2005年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Atomic Force Microscopy on Imogolite, Aluminosilicate Nanotube, Adsorbed on Au(111) Surface (2005)
  • SHIGEKAWA Hidemi ID: 9000107395467

    Institute of Applied Physics, CREST, Japan Science and Technology Corporation 'JST), University of Tsukuba (2001年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Interactive Force between Cyclodextrin Inclusion Complexes Studied by Atomic Force Microscopy (2001)
  • SHIGEKAWA Hidemi ID: 9000248242104

    Graduate School of Pure and Applied Sciences, University of Tsukuba (2013年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Direct Probing of Transient Photocurrent Dynamics in p-WSe_2 by Time-Resolved Scanning Tunneling Microscopy (2013)
  • Shigekawa Hidemi ID: 9000252757527

    Department of Applied Physics, The University of Tokyo (1983年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Change of Energy-Level Distribution of Photoemission Sources in Al and Zn Caused by Scratching (1983)
  • Shigekawa Hidemi ID: 9000252758278

    Department of Applied Physics, The University of Tokyo (1984年 CiNii収録論文より)

    CiNii収録論文: 1件

    • A Note on Electron Transfer to Exoelectron Emission Sources from Scratched Aluminum (1984)
  • Shigekawa Hidemi ID: 9000252758903

    Department of Applied Physics, The University of Tokyo (1985年 CiNii収録論文より)

    CiNii収録論文: 1件

    • A Method for Determining the Activation Rates of PSEE Centers in Scratched Aluminum by Varying the Stimulation Intensity (1985)
  • Shigekawa Hidemi ID: 9000252762863

    Institute of Material Science, University of Tsukuba (1990年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Dependence of the Carrier Concentration Profile at the Si MBE Layer/p-Si Substrate Interface on the Si Substrate Preparation Method (1990)
  • Shigekawa Hidemi ID: 9000252951604

    Department of Applied Physics, The University of Tokyo (1982年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Storage Effect in Photostimulated Exoelectron Emission from Scratched Aluminum (1982)
  • Shigekawa Hidemi ID: 9000252952439

    Department of Applied Physics, The University of Tokyo (1983年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Intensity vs Time Profiles of Photostimulated Exoelctron Emission from Scratched Aluminum (1983)
  • Shigekawa Hidemi ID: 9000252952465

    Department of Applied Physics, The University of Tokyo (1983年 CiNii収録論文より)

    CiNii収録論文: 1件

    • An Improved Method for Determining the Emission Rate and Source Population of PSEE (1983)
  • Shigekawa Hidemi ID: 9000252960410

    Department of Applied Physics, the University of Tokyo (1987年 CiNii収録論文より)

    CiNii収録論文: 1件

    • Component Assignments of the Raman Spectrum from Highly Elongated Silica Glass Filbers (1987)
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