Search Results1-13 of  13

  • 喜多 俊文 ID: 9000004410081

    武田薬品・開拓2研 (1995 from CiNii)

    Articles in CiNii:1

    • Actinomadura sp.AL-74539の産生する新規血小板Glycoprotein IIb/IIIa拮抗物質TAN-2020 : 有機化学・天然物化学 (1995)
  • 喜多 俊文 ID: 9000008529620

    Articles in CiNii:1

    • 企業から見た新実用新案制度の活用法 (ミニ特集:新実用新案制度その後) (1995)
  • 喜多 俊文 ID: 9000010065395

    Articles in CiNii:1

    • 島津製作所の知財教育と特許戦略 (特集2 "技術立社"を目指す企業の知的財産戦略) (2005)
  • 喜多 俊文 ID: 9000367401711

    Articles in CiNii:1

    • Impact of visceral fat on gene expression profile in peripheral blood cells in obese Japanese subjects (2016)
  • 喜多 俊文 ID: 9000398032420

    Articles in CiNii:1

    • Hypoxanthine secretion from human adipose tissue and its possible increase in hypoxia (2017)
  • KITA Toshifumi ID: 9000019186929

    (株)島津製作所 (2012 from CiNii)

    Articles in CiNii:1

    • Regulations and Compliance for Chemical Research and Development : The Relationship between Intellectual Property and the Analytic Chemistry (2012)
  • KITA Toshifumi ID: 9000303984978

    Nagoya Institute of Technology (2013 from CiNii)

    Articles in CiNii:1

    • J211012 The defects formation induced by cyclic compressive stress and residual tensile strength on single crystalline silicon (2013)
  • KITA Toshifumi ID: 9000304691876

    Nagoya Institute of Technology (2014 from CiNii)

    Articles in CiNii:1

    • J2240305 Effect of stress ratio on fatigue damage accumulation process in single crystalline silicon (2014)
  • KITA Toshifumi ID: 9000305590868

    Nagoya Institute of Technology (2014 from CiNii)

    Articles in CiNii:1

    • 302 Observation of fatigue damage accumulation in silicon under cyclic loading (2014)
  • KITA Toshifumi ID: 9000308047508

    Nagoya Institute of Technology (2013 from CiNii)

    Articles in CiNii:1

    • 525 Observation of the fatigue damage of silicon under compressive stress using electron beam induced current (2013)
  • KITA Toshifumi ID: 9000386209603

    Nagoya Institute of Technology (2017 from CiNii)

    Articles in CiNii:1

    • Observation of Fatigue Fracture Origin in Single Crystal Silicon by Transmission Electron Microscope (2017)
  • KITA Toshihumi ID: 9000304977418

    Nagoya Institute of Technology (2015 from CiNii)

    Articles in CiNii:1

    • 129 Effect of liquid environment to fatigue fracture of single crystal silicon (2015)
  • Kita Toshifumi ID: 9000305589507

    Nagoya Institute of Technology (2014 from CiNii)

    Articles in CiNii:1

    • 20pm3-PM007 Fatigue test with different stress ratio for single crystalline silicon thin film (2014)
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