Search Results1-10 of  10

  • OIGAWA Haruhiro ID: 9000404507785

    Institute of Applied Physics, University of Tsukuba (2004 from CiNii)

    Articles in CiNii:1

    • Development of femtosecond time-resolved scanning tunneling microscopy (2004)
  • OIGAWA Haruhiko ID: 9000003447707

    Articles in CiNii:9

    • Interaction between Si(100)Surface Dimers and Dynamics of Phase Defects Formed on Dimer Rows at 6 K Studied by Scanning Tunneling Microscopy (1997)
    • Development of femtosecond time-resolved scanning tunneling microscopy (2004)
    • What Governs the Si(100) Low Temperature Phase? (2003)
  • OIGAWA Haruhiro ID: 9000253647834

    Institute of Materials Science, University of Tsukuba (1990 from CiNii)

    Articles in CiNii:1

    • STM observation of (NH4)2Sx-treated GaAs(100) surface. (1990)
  • OIGAWA Haruhiro ID: 9000253647847

    Institute of Materials Science, University of Tsukuba (1990 from CiNii)

    Articles in CiNii:1

    • Stabilization of GaAs surface by sulfur treatment. (1990)
  • OIGAWA Haruhiro ID: 9000253648466

    Institute of Materials Science, University of Tsukuba (1994 from CiNii)

    Articles in CiNii:1

    • Superstructures of Se-Treated GaAs(001) Surface Studied by Scanning Tunneling Microscopy. (1994)
  • OIGAWA Haruhiro ID: 9000253649031

    Institute of Materials Science, Center for Tsukuba Advanced Research Alliance (TARA), University of Tsukuba (1997 from CiNii)

    Articles in CiNii:1

    • Interaction between Si(100) Surface Dimers and Dynamics of Phase Defects Formed on Dimer Rows at 6K Studied by Scanning Tunneling Microscopy. (1997)
  • Oigawa H. ID: 9000003392231

    University of Tsukuba (1993 from CiNii)

    Articles in CiNii:2

    • 13a-DF-12 Suppression of Metal/GaAs Interfacial Reactions by Complex Interlayer (1993)
    • 3a-S-2 Se/Te超薄膜ヘテロ構造の非破壊深さ方向解析 (1985)
  • Oigawa Haruhiro ID: 9000256111792

    Articles in CiNii:1

    • What Governs the Si(100) Low Temperature Phase? (2003)
  • Oigawa Haruhiro ID: 9000347154745

    筑波大・数理物質科学研究科 (2013 from CiNii)

    Articles in CiNii:1

    • Time-resolved STM probing and simulation analysis of carrier dynamics in semiconductor (2013)
  • Oigawa Haruhiro ID: 9000403546269

    Faculty of Pure and Applied Science, University of Tsukuba (2017 from CiNii)

    Articles in CiNii:1

    • Optical Pump-Probe STM (2017)
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