Search Results1-20 of  47

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  • 大谷 幸利 ID: 9000404328829

    Articles in CiNii:1

    • Technical Trend and Prospect of Interferometry (2019)
  • OTANI Yukitoshi ID: 9000404506636

    Center for Optical Research and Education (CORE), Utsunomiya University (2013 from CiNii)

    Articles in CiNii:1

    • Light-driven nano-micromachine (2013)
  • 大谷 幸利 ID: 9000376556982

    Articles in CiNii:1

    • Spectroscopic full-field imaging of Stokes parameters for defect detection (2016)
  • 大谷 幸利 ID: 9000377370269

    Articles in CiNii:1

    • Spectroscopic full-field imaging of Stokes parameters for defect detection (2017)
  • 大谷 幸利 ID: 9000402269427

    Articles in CiNii:1

    • 宇都宮大学 先端光工学専攻/オプティクス教育研究センター 偏光カメラとその応用 (特集 ブーム到来か!偏光カメラ) (2019)
  • 大谷 幸利 ID: 9000404145357

    Articles in CiNii:1

    • ストークス偏光計によるレンズの傷検査 (特集 光学部品および材料の計測・評価技術) (2019)
  • 大谷 幸利 ID: 9000404326345

    Articles in CiNii:1

    • Differential interference contrast video microscope using pixelated polarization camera (2018)
  • OTANI Yukitoshi ID: 1000010233165

    Articles in CiNii:216

    • LD直交2周波光源を用いた共通光路干渉計による表面形状計測 (1995)
    • 位相シフトモアレ法による液晶基板のフラットネス測定法 (1995)
    • 局所サンプリング位相シフト法による高感度表面形状測定 (1995)
  • OTANI Yukitoshi ID: 9000020797512

    Articles in CiNii:1

    • Profile Measurement of Rough Surface using the Phase-shifting Abramson Interferometry. (1994)
  • OTANI Yukitoshi ID: 9000403427326

    宇都宮大学工学部・光工学プログラム/オプティクス教育研究センター (2019 from CiNii)

    Articles in CiNii:1

    • Technical Trend and Prospect of Interferometry (2019)
  • Otani Yukitoshi ID: 9000020658743

    Articles in CiNii:1

    • Magnetic Field Sensing using Magnetic Fluids. (1993)
  • Otani Yukitoshi ID: 9000020796359

    Articles in CiNii:1

    • Moire topography with sensitivity of sub-micrometer. (1989)
  • Otani Yukitoshi ID: 9000345226525

    Articles in CiNii:6

    • Spectroscopic Mueller matrix microscope and its application to bio-imaging (2014)
    • 3D profilometry by polarization pattern projection (2015)
    • Optical Studies for Polymer Processing Engineer(Chapter 2)Measurement Theory and Method of Light Properties(2.8)Optical Interferometry (2016)
  • Otani Yukitoshi ID: 9000345226937

    Utsunomiya University (2016 from CiNii)

    Articles in CiNii:1

    • Nano structure measurement using decomposition analysis by spectroscopic Mueller polarimetry (2016)
  • Otani Yukitoshi ID: 9000345276250

    Utsunomiya university (2016 from CiNii)

    Articles in CiNii:1

    • 3D surface measurement using uni-axis image fiber system (2016)
  • Otani Yukitoshi ID: 9000345276257

    Utsunomiya University (2016 from CiNii)

    Articles in CiNii:1

    • Phase sensitive CT measurement using a pixelated polarizing shearing interferometer (2016)
  • Otani Yukitoshi ID: 9000345276573

    Utsunomiya university (2016 from CiNii)

    Articles in CiNii:1

    • 偏光パターン投影による同軸三次元形状計測-第3報 (2016)
  • Otani Yukitoshi ID: 9000347152775

    Utsunomiya University (2014 from CiNii)

    Articles in CiNii:1

    • 偏光パターン投影による同軸三次元形状計測 (2014)
  • Otani Yukitoshi ID: 9000347153656

    Utsunomiya University (2014 from CiNii)

    Articles in CiNii:1

    • Single nano particle imaging method by photothermal effect (5th report):Heat transfer analysis around single nanoparticle (2014)
  • Otani Yukitoshi ID: 9000347153659

    Graduate School of Engineering (2014 from CiNii)

    Articles in CiNii:1

    • フォトサーマル・マランゴニ対流による液滴駆動(第3報) (2014)
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