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  • 奥山 幸祐 ID: 9000008561394

    Articles in CiNii:1

    • ネットワークを支える半導体プロセス (特集 ネットワーク時代を支える半導体) (2001)
  • OKUYAMA Kosuke ID: 9000004741445

    Hitachi, Ltd., Semiconductor Integrated Circuits (2003 from CiNii)

    Articles in CiNii:3

    • Circuit-Level Simulation of ESD Prediction for Input Protection Circuits (2003)
    • Impact of High-Temperature RTA for CMOSFET Design in the Deep Submicron Regime (1995)
    • Impact of High-Temperature RTA Process for Deep-Submicron CMOSFETs Design (1996)
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