Search Results1-3 of  3

  • 小野 瑞城 ID: 9000356652469

    Articles in CiNii:1

    • High-Density User-Programmable Logic Array Based on Adjacent Integration of Pure-CMOS Crossbar Antifuse into Logic CMOS Circuits (2017)
  • ONO Mizuki ID: 9000004969877

    ULSI Research Laboratories, R&D Center, TOSHIBA CORPORATION (1996 from CiNii)

    Articles in CiNii:2

    • Dependence of Various Electrical Characteristics on Channel Impurity Concentration in 0.1μm CMOSFETs (1994)
    • Study on the Realization of High Performance MOSFETs with Gate lenths 0.1μm and Below (1996)
  • ONO Mizuki ID: 9000004970863

    Advanced LSI Research Laboratory, Corporate R&D Center, Toshiba Corporation (2005 from CiNii)

    Articles in CiNii:2

    • HfSiON : Its superb characteristics as a thermally stable gate dielectric and the remaining issue for its application to real LSIs (2005)
    • HfSiON Its superb characteristics as a thermally stable gate dielectric and the remaining issue for its application to real LSIs (2005)
Page Top