Search Results1-9 of  9

  • 川口 雄介 ID: 9000015341268

    Articles in CiNii:1

    • Low-voltage power MOSFETs achieving high performance and low cost (2010)
  • 川口 雄介 ID: 9000377379525

    Articles in CiNii:1

    • Shoot-Through mechanism and elimination in Trench Field Plate Power MOSFET (2014)
  • 川口 雄介 ID: 9000377382495

    Articles in CiNii:1

    • A Study of Multiple Stepped Oxide Field Plate Structure for Improving a 100 V Class Trench MOSFET (2015)
  • 川口 雄介 ID: 9000405701416

    Articles in CiNii:1

    • Optimum Structure Design and Device Performance Evaluation for a 100V-rated Two-step-oxide Field-plate Trench MOSFET (2019)
  • 川口 雄介 ID: 9000405701530

    Articles in CiNii:1

    • The Impact of Alpha-Particle irradiation on Power MOSFETs and the Alpha-Particle Shielding by Thick Cu Plating Film (2019)
  • 川口 雄介 ID: 9000405701841

    Articles in CiNii:1

    • Optimum Structure Design and Device Performance Evaluation for a 100V-rated Two-step-oxide Field-plate Trench MOSFET (2019)
  • 川口 雄介 ID: 9000405701982

    Articles in CiNii:1

    • The Impact of Alpha-Particle irradiation on Power MOSFETs and the Alpha-Particle Shielding by Thick Cu Plating Film (2019)
  • KAWAGUCHI Yusuke ID: 9000004929331

    Articles in CiNii:21

    • Multi Chip Module with Minimum Parasitic Inductance for New Generation Voltage Regulator (2005)
    • Trends of Power Semiconductor Devices for Power Supply (2005)
    • Micro current probe for VRM development (2006)
  • Kawaguchi Yusuke ID: 9000290371485

    Discrete Semiconductor Division, Toshiba Corporation (2014 from CiNii)

    Articles in CiNii:1

    • CT-2-5 Trend of Si Power Semiconductor Development and Applications (2014)
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