Search Results1-7 of  7

  • 星 文和 ID: 9000318155178

    Articles in CiNii:1

    • Method for Identifying Media Using Polarization State of Diffuse Reflection (2015)
  • 星 文和 ID: 9000334739747

    Articles in CiNii:1

    • Analysis of Relationship between Surface Profile of Paper and Polarization state of Diffuse Reflection (2015)
  • 星 文和 ID: 9000367016029

    Articles in CiNii:1

    • Proposal of Effective Utilization of Parameter Design on System-Selection phase (2016)
  • HOSHI Fumikazu ID: 9000004424773

    Department of Electronics Engineering, Graduate School of Engineering, Tohoku University (2003 from CiNii)

    Articles in CiNii:10

    • Quantitative analysis of thickness of initial growth layer in CoCr-based perpendicular media with various underlayer and magnetic layer materials (2001)
    • Magnetic properties and microstructure for CoCrPtB perpendicular thin film media with non-magnetic CoCr layer and very thin C layer (2001)
    • Study on Magnetic Field Determined from Vanishing Rotational Hysteresis Loss for CoCr-based Perpendicular Thin Film Media (2001)
  • HOSHI Fumikazu ID: 9000004748351

    Articles in CiNii:11

    • 同軸短絡構造を用いた指向性可変アンテナ (2006)
    • Analysis of inductance originated in short-circuited coaxial structure (2004)
    • Analysis of inductance originated in short-circuited coaxial structure (2004)
  • Hoshi F. ID: 9000257955902

    Department of Electronics Engineering, Graduate School of Engineering, Tohoku Univ. (2002 from CiNii)

    Articles in CiNii:1

    • Thickness Dependence of the Magnetic Field Determined from the Vanishing Rotational Hysteresis Loss for CoCr-Based Perpendicular Thin-Film Media. (2002)
  • Hoshi F. ID: 9000257955905

    Department of Electronics Engineering, Graduate School of Engineering, Tohoku Univ. (2002 from CiNii)

    Articles in CiNii:1

    • Magnetic Properties and Microstructure of CoCrPtB Perpendicular Thin-Film Media with a Co60Cr40 Layer and a Very Thin C Layer. (2002)
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