Search Results1-20 of  22

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  • 杉山 耕一 ID: 9000003409818

    三重大学工学部 (1986 from CiNii)

    Articles in CiNii:2

    • 29a-RC-9 照射GaPの深い準位と電子統計に基づくX_1-X_3吸収バンドの補正 (1986)
    • 29p-RC-4 電子ビーム照射したGaPの損傷分布と電子線散乱 (1986)
  • 杉山 耕一 ID: 9000003418178

    通研 (1966 from CiNii)

    Articles in CiNii:10

    • n型GaAs中のトラップ : 半導体・イオン結晶・光物性 (1966)
    • イオン衝撃による清浄Ge表面の伝導 : 半導体 (1960)
    • イオン衝撃及び焼俣しによるゲルマニウム表面の格子欠陥 : 半導体 (1961)
  • 杉山 耕一 ID: 9000008555217

    Articles in CiNii:1

    • 省エネルギ-タイプ三相共心形電力ケ-ブルの諸特性 (1980)
  • 杉山 耕一 ID: 9000010633528

    Articles in CiNii:1

    • わが社の省エネ活動(7)BOG圧縮機 樹脂製弁プレートを使用した吸入・吐出弁の開発 (2008)
  • 杉山 耕一 ID: 9000013969403

    昭和大学医学部脳神経外科 (2008 from CiNii)

    Articles in CiNii:4

    • 巨大非機能性下垂体腺腫の治療方針 (2002)
    • プロラクチノーマに対する Cabergoline の治療効果 (2005)
    • Advancement of diagnosis and treatment in pituitary apoplexy (2005)
  • 杉山 耕一 ID: 9000017890064

    Articles in CiNii:1

    • ゲルマニウムの不純物伝導領域におけるピエゾ抵抗および磁気抵抗効果 (1963)
  • 杉山 耕一 ID: 9000018018879

    Articles in CiNii:1

    • 高圧,ストレス用クライオスタット(実験技術シリーズ 低温-7-) (1966)
  • 杉山 耕一 ID: 9000021017554

    Articles in CiNii:1

    • 277回例会記事 (2001)
  • 杉山 耕一 ID: 9000021089106

    Articles in CiNii:1

    • 281回例会記事 (2002)
  • 杉山 耕一 ID: 9000022825411

    Articles in CiNii:1

    • THM Growth of Ternary and Multinary Chalcopyrite Semiconductors (1999)
  • SUGIYAMA K. ID: 9000253278982

    Department of Electrical Engineering, Nagoya University (1972 from CiNii)

    Articles in CiNii:1

    • Electrical Conduction and Glass Transition of Polyvinylchloride (1972)
  • SUGIYAMA Koichi ID: 9000006597718

    東邦ガス(株) (1997 from CiNii)

    Articles in CiNii:1

    • Characteristics of Low-Speed Streaks in the Flow of Drag-Reducing Surfactant Solution (1997)
  • SUGIYAMA Koichi ID: 9000021043304

    Department of Neurosurgery, Showa University School of Medicine (2002 from CiNii)

    Articles in CiNii:1

    • THE CORRELATION BETWEEN DNA DAMAGE AND CELL MEMBRANE DAMAGE BASED ON THE ANALYSIS OF THE NEW OXIDATIVE STRESS MARKER IN PATIENTS WITH SUBARACHNOID HEMORRHAGE (2002)
  • SUGIYAMA Koichi ID: 9000253326493

    Department of Electrical and Electronic Engineering, Faculty of Engineering, Mie University. (1996 from CiNii)

    Articles in CiNii:1

    • Solution growth of chalcopyrite semiconductors (1996)
  • SUGIYAMA Koichi ID: 9000256238365

    東邦ガス(株) (1997 from CiNii)

    Articles in CiNii:1

    • Characteristics of Low-Speed Streaks in the Flow of Drag-Reducing Surfactant Solution (1997)
  • Sugiyama Koichi ID: 9000002244046

    Department of Electrical and Electronic Engineering, Faculty of Engineering, Mie University (1999 from CiNii)

    Articles in CiNii:5

    • Solution growth of chalcopyrite semiconductors (1996)
    • THM Growth of Ternary and Multinary Chalcopyrite Semiconductors (1999)
    • Single Crystal Growth of Chalcopyrite Semiconductors by THM (1992)
  • Sugiyama Koichi ID: 9000005004071

    Adavanced Cruise-Assist Highway System Research Association Hitachi Cable Laboratory (1998 from CiNii)

    Articles in CiNii:1

    • Development of Road Condition Sensing System (1998)
  • Sugiyama Koichi ID: 9000273024797

    Seirei Memorial Hospital (2014 from CiNii)

    Articles in CiNii:1

    • Find AF—Efforts to find patients with atrial fibrillation— (2014)
  • Sugiyama Koichi ID: 9000397841438

    Seirei Memorial Hospital (2018 from CiNii)

    Articles in CiNii:1

    • Easy screening of outpatients for atrial fibrillation by analyzing fingertip pulse wave variation (2018)
  • Sugiyama Kouichi ID: 9000253420492

    Hitachi Cable, Ltd. (1988 from CiNii)

    Articles in CiNii:1

    • Fuzzy theory-based fault location algorithm for electric power transmission lines with OPGW. (1988)
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