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  • KAWAKITA T. ID: 9000005822100

    Graduate School of Materials Science , Nara Institute of Science and Technology (2002 from CiNii)

    Articles in CiNii:3

    • Analysis of Reliability of Low-Temperature poly-Si TFTs with Gate-Overlapped LDD (2002)
    • Analysis of Reliability of Low-Temperature poly-Si TFTs with Gate-Overlapped LDD (2002)
    • Analysis of Reliability of Low-Temperature poly-Si TFTs with Gate-Overlapped LDD (2002)
  • Kawakita Tesuo ID: 9000005001180

    Articles in CiNii:3

    • 転写バンプTAB方式による薄型パッケ-ジ (チップ部品・表面実装技術<特集>) -- (表面実装技術) (1989)
    • 極微細電極上への浸漬法によるはんだバンプ形成技術の開発 (MES'97(第7回マイクロエレクトロニクスシンポジウム論文集)) (1997)
    • Development of Nickel Electroless Plating Bump for TAB method (1995)
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