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  • Ohno Morifumi ID: 9000005735037

    National Institute of Advanced Industrial Science and Technology (2011 from CiNii)

    Articles in CiNii:19

    • Flat-band Voltage Tunability and No Depletion Effect of Poly-Si Gate CMOS with Nanometer-size Metal Dots at the Poly-Si/Dielectric Interface (2004)
    • Development of Cryogenic Readout Electronics for Far-Infrared Astronomical Focal Plane Array (2011)
    • Relationship between Nitrogen Profile and Reliability of Heavily Oxynitrided Tunnel Oxide Films for Flash Electrically Erasable and Programmable ROMs (1995)
  • Tauchi Kazuya ID: 9000402475058

    KEK IPNS (2018 from CiNii)

    Articles in CiNii:1

    • Development of integration-type SOI radiation pixel sensor (2018)
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