Search Results1-16 of  16

  • 眞田 則明 ID: 9000283856436

    アルバック・ファイ (2007 from CiNii)

    Articles in CiNii:1

    • 固定化リゾチウムのTOF-SIMSによる評価 (2007)
  • 眞田 則明 ID: 9000283856929

    アルバック・ファイ (2007 from CiNii)

    Articles in CiNii:1

    • 固定化リゾチウムのTOF-SIMSによる評価 (2007)
  • 眞田 則明 ID: 9000399551397

    Articles in CiNii:1

    • Report on Question and Answer at JASIS Conference 2018 "Practical surface analysis : knowledge of surface analysis for beginners" (2018)
  • 眞田 則明 ID: 9000404470526

    Articles in CiNii:1

    • 21. Basis and the latest trends in imaging : Surface and Interface Imaging with XPS and TOF-SIMS (2019)
  • SANADA NORIAKI ID: 9000283848183

    ULVAC-PHI (2010 from CiNii)

    Articles in CiNii:1

    • Ar Gas Cluster Ion Beam Applications in XPS and TOF-SIMS (2010)
  • SANADA Noriaki ID: 9000002536501

    Articles in CiNii:6

    • 電子分光法による表面・界面の解析 (物理表面の物理分析技術<特集>) (1991)
    • 表面状態の解析-33-紫外光電子分光法(UPS),逆光電子分光法(IPES) (1994)
    • 表面分析講座-9-オ-ジェ電子分光法(AES,SAM) (1992)
  • SANADA Noriaki ID: 9000321622313

    ULVAC-PHI, Inc. (2016 from CiNii)

    Articles in CiNii:1

    • Laboratory Hard X-ray Photoelectron Spectroscopy (2016)
  • Sanada N. ID: 9000398609709

    ULVAC-PHI, Inc. (2008 from CiNii)

    Articles in CiNii:1

    • Recent Progress of Cluster Ion Beam Technology And Its Application for Surface Analysis (2008)
  • Sanada Noriaki ID: 9000002536354

    ULVAC-PHI, Inc. (2014 from CiNii)

    Articles in CiNii:54

    • New Surface Analyses (2003)
    • X-ray Photoelectron Spectroscopy (2006)
    • Influence of C_<60> Ion Beam Angle of Incidence Upon XPS Depth Profiling for Polymers (2007)
  • Sanada Noriaki ID: 9000256288064

    Research Institute of Electronics, Shizuoka University (1992 from CiNii)

    Articles in CiNii:1

    • Auger Electron Spectroscopy (AES and SAM) (1992)
  • Sanada Noriaki ID: 9000283800359

    ULVAC-PHI, Inc. (2005 from CiNii)

    Articles in CiNii:1

    • Sputter depth profiling of organic devices using C60 ion beam (2005)
  • Sanada Noriaki ID: 9000283848263

    ULVAC-PHI (2010 from CiNii)

    Articles in CiNii:1

    • Affects of a Drug on Rat Tail Cross-Sections Imaged by TOF-SIMS (2010)
  • Sanada Noriaki ID: 9000317149631

    ULVAC-PHI, Inc. (2015 from CiNii)

    Articles in CiNii:1

    • Recent Progress of Surface Analysis (AES, XPS, and TOF-SIMS) and Their Application to Corrosion Analysis (2015)
  • Sanada Noriaki ID: 9000345210584

    ULVAC-PHI, INCORPORATED (2016 from CiNii)

    Articles in CiNii:1

    • Laboratory Hard X-ray Photoelectron Spectroscopy (2016)
  • Sanada Noriaki ID: 9000347155069

    アルバック・ファイ株式会社 (2013 from CiNii)

    Articles in CiNii:1

    • Quantitative organic dopants analysis in OLED materials by using TOF-SIMSB (2013)
  • Sanada Noriaki ID: 9000347155076

    アルバック・ファイ株式会社 (2013 from CiNii)

    Articles in CiNii:1

    • In-situ GCIB Cross-section Imaging of Organic Materials using TOF-SIMS (2013)
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