Search Results1-19 of  19

  • 竹中 久貴 ID: 9000003002698

    NTT研究所 (1988 from CiNii)

    Articles in CiNii:10

    • 強誘電液晶の相転移 (1978)
    • 3a-AA-9 LATの相転位とX線散漫散乱 (1978)
    • 3p-AA-7 KH_3(SeO_3)_2の強弾性転移とX線散漫散乱 (1978)
  • 竹中 久貴 ID: 9000003410239

    Articles in CiNii:2

    • スパッタ法による軟X線多層膜の作製と評価 (X線顕微鏡特集号) (1990)
    • 29a-H-7 スパッタ法W/C人工格子膜のX線反射特性 (1986)
  • 竹中 久貴 ID: 9000010577016

    Articles in CiNii:1

    • 軟X線多層膜の光学素子への応用と展開 (特集 光学薄膜) (2008)
  • 竹中 久貴 ID: 9000242668830

    Articles in CiNii:1

    • Current Status for Soft X-ray/Extreme Ultra-Violet Optical Devices (2014)
  • 竹中 久貴 ID: 9000253694558

    NTT境界領域研 (1994 from CiNii)

    Articles in CiNii:1

    • レーザーエネルギー応用 (1994)
  • TAKENAKA Hisataka ID: 9000000325740

    Center for Materials Development & Analytical Technology,NTT Advanced Technology Corporation (2001 from CiNii)

    Articles in CiNii:1

    • Possible Formation of Ultrafine Co_<1-X>Ca_XFe_2O_4 Particles and Their Magnetic Properties (2001)
  • TAKENAKA Hisataka ID: 9000005000964

    NKK境界領域研究所 (1996 from CiNii)

    Articles in CiNii:4

    • フォトンテクノロジーワークショップ報告 (1996)
    • Measurements of Electron Attenuation Length using Metallic Multilayers (1995)
    • 軟X線光学用多層膜 (機能性薄膜<特集>) (1994)
  • TAKENAKA Hisataka ID: 9000017389339

    NTT-AT Nanofabrication Corporation (2010 from CiNii)

    Articles in CiNii:2

    • Techniques for fabricating Fresnel zone plates for x-ray focusing : Current status and future challenges (2010)
    • Depth Profiling of Multilayered Si/Ti by Resonance-enhanced Multiphoton Ionization SNMS (2010)
  • TAKENAKA Hisataka ID: 9000020268189

    NTT Applied Electronics Laboratories (1989 from CiNii)

    Articles in CiNii:1

    • Application of a multilayer-coated mirror to soft X-ray monochromatization. (1989)
  • TAKENAKA Hisataka ID: 9000253648752

    NTT Interdisciplinary Research Laboratories (1995 from CiNii)

    Articles in CiNii:1

    • Measurements of Electron Attenuation Length using Metallic Multilayers. (1995)
  • TAKENAKA Hisataka ID: 9000253690770

    Advanced Materials and Characterization Laboratory, NTT Applied Electronics Laboratories (1990 from CiNii)

    Articles in CiNii:1

    • Preparation and characterization of sputtered multilayers for soft X-ray reflectors. (1990)
  • TAKENAKA Hisataka ID: 9000253696709

    Materials Development & Analytical Technology Center NTT Advanced Technology Corporation (1997 from CiNii)

    Articles in CiNii:1

    • Soft X-Ray Optics. Brief History of Multilayer Mirrors for Soft X-Ray Optics. II. Development of Multilayer Mirrors from the Late 1980's to the Present and Future Trends.:Development of Multilayer Mirrors from the Late 1980's to the Present and Future Trends (1997)
  • TAKENAKA Hisataka ID: 9000253696710

    Materials Development & Analytical Technology Center, NTT Advanced Technology Corporation (1997 from CiNii)

    Articles in CiNii:1

    • Soft X-Ray Optics. Brief History of Multilayer Mirrors for Soft X-Ray Optics. I. Discovery of the Potential of Large D-Spacing Bragg-Reflectors for X-Ray/EUV Applications and Their Development from the Early 1970's to the Late 1980's.:Discovery of the Potential of Large D-Spacing Bragg-Reflectors for X-Ray/EUV Applications and Their Development from the Early 1970's to the Late 1980's (1997)
  • TAKENAKA Hisataka ID: 9000261052164

    (株)トヤマ (2013 from CiNii)

    Articles in CiNii:1

    • Current Status and Future Challenges for Fresnel Zone Plate Type X-Ray Focusing Devices (2013)
  • Takenaka H. ID: 9000003210077

    NTT-AT (2000 from CiNii)

    Articles in CiNii:3

    • The fabrication and properties of Fe/C multilayers (1999)
    • Fabrication and magnetic properties of nanoscale magnetic dot arrays (2000)
    • 28a-PS-97 The fabrication and properties of Fe/C multilayers (1999)
  • Takenaka H. ID: 9000253696827

    HIT LASTI (1997 from CiNii)

    Articles in CiNii:1

    • レーザーエネルギー応用 (1997)
  • Takenaka H. ID: 9000004905222

    NTT Advanced Technology Co. (2007 from CiNii)

    Articles in CiNii:20

    • Brief History of Multilayer Mirrors for Soft X-Ray Optics I -Discovery of the Potential of Large D-Spacing Bragg-Reflectors for X-Ray/EUV Applications and Their Development from the Early 1970's to the Late 1980's- (1997)
    • Brief History of Multilayer Mirrors for Soft X-Ray Optics II -Development of Multilayer Mirrors from the Late 1980's to the Present and Future Trends- (1997)
    • Multiple BN Delta-layers as the Raference Material for Ultra-shallow Depth Profiling and Evaluation of the Sputtering Rate Variation (2003)
  • Takenaka Hisataka ID: 9000258703866

    NTT Advanced Technology Corporation (2009 from CiNii)

    Articles in CiNii:1

    • Depth profiling of multilayered Si/Ti by resonant multi-photon ionization SNMS (2009)
  • Takenaka Hisataka ID: 9000283847601

    NTT-AT Nanofabrication Corporation (2010 from CiNii)

    Articles in CiNii:1

    • A chemical state of titanium affecting secondary-ion yield change –SIMS/SNMS analysis for Si/Ti multilayer- (2010)
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