Search Results1-11 of  11

  • 遠藤 久満 ID: 9000020050419

    阪大工 (1980 from CiNii)

    Articles in CiNii:1

    • 電子顕微鏡像の高速画像計測処理装置の開発とミクロ構造の動的解析 (1980)
  • 遠藤 久満 ID: 9000020062595

    阪大工 (1976 from CiNii)

    Articles in CiNii:1

    • 斜長石の規則格子構造に対する原子位置の考察 (1976)
  • 遠藤 久満 ID: 9000238858711

    Articles in CiNii:1

    • 高分解能電子顕微鏡によるY系-高温超電導材料の酸素欠損の検出 (1988)
  • 遠藤 久満 ID: 9000242849820

    大阪大 (1987 from CiNii)

    Articles in CiNii:1

    • 30p-EB-7 Ti_<48.5> Ni_<51.5>のX相析出に伴う散漫散乱(X線・粒子線) (1987)
  • 遠藤 久満 ID: 9000246831394

    阪大工 (1986 from CiNii)

    Articles in CiNii:1

    • 1a-FA-3 Si[110]における電子線照射損傷過程の観察(格子欠陥) (1986)
  • ENDOH Hisamitsu ID: 9000252844970

    Department of Applied Physics, Faculty of Engineering, Osaka University, Yamadaoka (1986 from CiNii)

    Articles in CiNii:1

    • Analytical Atom Resolution Electron Microscope (1986)
  • ENDOH Hisamitsu ID: 9000253320625

    Department of Applied Physics, Faculty of Engineering Osaka University (1976 from CiNii)

    Articles in CiNii:1

    • High Resolution Electron Microscopic Images of Crystal Lattices (1976)
  • Endoh H. ID: 1000020027907

    Faculty of Engineering and Design, Kyoto Insitute of Technology (2003 from CiNii)

    Articles in CiNii:78

    • Standardization of the Computer Simulation of High-Resolution Transmission Electron Microscope Image-1 -Calculation of Diffraction Amplitudes by the Multi-Slice Method- (1994)
    • Compressive Deformation and Microstructures of Composite Aluminas (1999)
    • Validity of spherical aberration free focus condition (2000)
  • Endoh Hisamitsu ID: 9000252882604

    京都工芸繊維大学工芸学部 (1989 from CiNii)

    Articles in CiNii:1

    • Observations of oxigen vacancies in high-Tc superconductors. III. (1989)
  • Endoh Hisamitsu ID: 9000252882609

    大阪大学工学部 (1989 from CiNii)

    Articles in CiNii:1

    • Electron spectroscopy and electron microscopy. (1989)
  • Endoh Hisamitsu ID: 9000252882630

    京都工芸繊維大学 (1994 from CiNii)

    Articles in CiNii:1

    • Standardization of the Computer Simulation of High-Resolution Transmission Electron Microscope Image-1. Calculation of Diffraction Amplitudes by the Multi-Slice Method.:Calculation of Diffraction Amplitudes by the Multi-Slice Method (1994)
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