Search Results1-6 of  6

  • 関 節子 ID: 9000003528548

    Articles in CiNii:3

    • Molecular SIMSにおけるイオン化 (〔日本質量分析学会〕イオン反応研究部会報告集) (1984)
    • 粒子線照射によるデソ-プションイオン化 (イオン化特集) (1986)
    • 3p GB-12 無秩序分布Eu^<3+>化合物におけるけい光の温度消光 (1979)
  • SEKI SETSUKO ID: 9000258701161

    Takushoku Univ. (2006 from CiNii)

    Articles in CiNii:1

    • Improvement of SIMS depth profiling for microarea analysis by minichip preparation technique (2006)
  • SEKI Setsuko ID: 1000040196944

    Articles in CiNii:17

    • Surface Analysis without Interference of Background Peaks by a Combined SIMS-ESDMS Technique (1995)
    • Improvements of the Accuracy of Depth Profiling in Secondary Ion Mass Spectrometry (SIMS) by using a Mini-Projection Technique (1996)
    • 先端追跡 (1997)
  • SEKI Setsuko ID: 9000020327382

    Central Research Laboratory, Hitachi, Ltd. (1983 from CiNii)

    Articles in CiNii:1

    • Application to Bio-Organic Compounds (1983)
  • SEKI Setsuko ID: 9000020620978

    Articles in CiNii:1

    • Preparation of a luminescent precipitate; Y2(WO4)3nH2O:Eu3+. (1984)
  • Seki Setsuko ID: 9000392018607

    Faculty of Engineering, Takushoku Univ. (2010 from CiNii)

    Articles in CiNii:1

    • SIMS analysis for ultra shallow layer by mesa-structure preparation (2010)
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