Search Results1-4 of  4

  • AOYAGI Sadao ID: 9000000790335

    JEOL Kansai Application Research Center (1999 from CiNii)

    Articles in CiNii:1

    • Magnification and scanning time dependence of secondary electron image contrast of ferroelectric domains in aged triglycine sulphate crystal (1999)
  • AOYAGI Sadao ID: 9000000790796

    JEOL Semiconductor Equipment Division, Application and Research Center (1999 from CiNii)

    Articles in CiNii:1

    • Initialization by erasing the surface potential of negatively charged insulators in scanning electron microscope (SEM) observation (1999)
  • AOYAGI Sadao ID: 9000000791428

    JEOL (2000 from CiNii)

    Articles in CiNii:1

    • Static capacitance contrast of LSI covered with an insulator film in low accelerating voltage scanning electron microscope (2000)
  • AOYAGI Sadao ID: 9000001274447

    JEOL Ltd (2000 from CiNii)

    Articles in CiNii:1

    • A new method for detecting and localizing cell markers endocytosed by fibroblasts in epoxy resin semi-thin sections using scanning electron microscopy combined with energy dispersive X-ray microanalysis after ion-etching (2000)
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