Search Results1-6 of  6

  • ARAKI Yuhzo ID: 9000002212779

    Laboratory of Beam Technology, The Technological University of Nagaoka (1988 from CiNii)

    Articles in CiNii:1

    • <RESEARCH REPORT>Time-Resolved Spectroscopic Measurement of Anode Plasma in Magnetically-Insulated Diode (1988)
  • Araki Yuhzo ID: 9000252986931

    The Graduate School at Nagatsuta, Tokyo Institute of Technology (1993 from CiNii)

    Articles in CiNii:1

    • <I>In Situ</I> Ellipsometric Observations of the Growth of Silicon Thin Films from Fluorinated Precursors, SiF<I><SUB>n</SUB></I>H<I><SUB>m</SUB></I> (<I>n</I>+<I>m</I>≤3) (1993)
  • Araki Yuhzo ID: 9000258121155

    Graduate School, Tokyo Institute of Technology, 259 Nagatsuta, Midori, Yokohama 227 (1994 from CiNii)

    Articles in CiNii:1

    • Si Epitaxy below 400°C from Fluorinated Precursors SiFnHm (n+m=< 3) under In Situ Observation with Ellipsometry (1994)
  • Araki Yuhzo ID: 9000392734946

    Articles in CiNii:1

    • <I>In Situ</I> Ellipsometric Observations of the Growth of Silicon Thin Films from Fluorinated Precursors, SiF<I><SUB>n</SUB></I>H<I><SUB>m</SUB></I> (<I>n</I>+<I>m</I>≤3) (1993)
  • Araki Yuhzo ID: 9000401634217

    Articles in CiNii:1

    • 1993-06-15 (1993)
  • Araki Yuhzo ID: 9000401645375

    Articles in CiNii:1

    • 1994-02-15 (1994)
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