Search Results1-16 of  16

  • ASAHI Toshiaki ID: 9000004821013

    The authors are with Central R & D Laboratory, Japan Energy Co., Ltd. (2000 from CiNii)

    Articles in CiNii:1

    • Pure Green Light-Emitting Diodes Based on High Quality ZnTe Substrates and a Thermal Diffusion Process (2000)
  • ASAHI Toshiaki ID: 9000019086506

    Nippon Mining and Metals Co. Ltd. (2010 from CiNii)

    Articles in CiNii:2

    • Properties and modeling of random errors in optical parameters measured with THz-TDS (2010)
    • Practical method to estimate the standard deviation in absorption coefficients measured with THz time-domain spectroscopy (2010)
  • ASAHI Toshiaki ID: 9000107365173

    Technology Development Center, JX Nippon Mining & Metals Corporation (2012 from CiNii)

    Articles in CiNii:1

    • Molecular Beam Epitaxy Growth of ZnTe Epilayers on c-Plane Sapphire (2012)
  • ASAHI Toshiaki ID: 9000252851287

    Imabarishi Ishikai Shimin Hospital (1993 from CiNii)

    Articles in CiNii:1

    • A CASE REPORT OF SPONTANEOUSLY PERFORATED PYOMETRA PRESENTING PERITONITIS (1993)
  • ASAHI Toshiaki ID: 9000253350414

    Imabarishi Ishikai Shimin Hospital (1992 from CiNii)

    Articles in CiNii:1

    • A CASE OF SOLID AND CYSTIC TUMOR OF THE PANCREAS IN AN AGED WOMAN (1992)
  • Asahi Toshiaki ID: 9000004337436

    Nikko-Materials CO., LTD. Toda-Plan (2003 from CiNii)

    Articles in CiNii:6

    • Growth and Characterization of Large Diameter CdTe Crystals (<Special Issue> Bulk Crystal Growth(II)) (1995)
    • Recent Developments in InP Crystal Growth(<Special Issue>: To Realize the perfect Crystallization) (1998)
    • Development of <100>, <110>ZnTe single crystals by the LEK method (2002)
  • Asahi Toshiaki ID: 9000006794301

    Nippon Mining and Metals Co. Ltd. (2010 from CiNii)

    Articles in CiNii:3

    • C-4-12 Dielectric properties of ZnTe crystal and its use in T-ray emission and detection (2008)
    • C-4-2 Estimation of random error in refractive index measured by THz-TDS (2010)
    • C-4-6 A Novel method of standard deviation estimation of optical parameters measured with THz-TDS (2009)
  • Asahi Toshiaki ID: 9000021109745

    Nippon Mining and Metals Co. Ltd. (2009 from CiNii)

    Articles in CiNii:1

    • Random error estimation in refractive index measured with the terahertz time domain spectroscopy (2009)
  • Asahi Toshiaki ID: 9000258145993

    Central Research and Development Laboratory, Japan Energy Corporation, 3–17–35 Niizo–Minami, Toda, Saitama 335–8502, Japan (1999 from CiNii)

    Articles in CiNii:1

    • Fe Doping and Preparation of Semi-Insulating InP by Wafer Annealing under Fe Phosphide Vapor Pressure. (1999)
  • Asahi Toshiaki ID: 9000258146049

    Central R & D Laboratory, Japan Energy Corporation, 3–17–35 Niizo–Minami, Toda, Saitama 335–8502, Japan (1999 from CiNii)

    Articles in CiNii:1

    • Growth of 100-mm-Diameter <100> InP Single Crystals by the Vertical Gradient Freezing Method. (1999)
  • Asahi Toshiaki ID: 9000401573963

    Articles in CiNii:1

    • Molecular Beam Epitaxy Growth of ZnTe Epilayers on $c$-Plane Sapphire (2012)
  • Asahi Toshiaki ID: 9000401685030

    Articles in CiNii:1

    • Growth of 100-mm-Diameter<100>InP Single Crystals by the Vertical Gradient Freezing Method (1999)
  • Asahi Toshiaki ID: 9000401685042

    Articles in CiNii:1

    • Fe Doping and Preparation of Semi-Insulating InP by Wafer Annealing under Fe Phosphide Vapor Pressure (1999)
  • Asahi Toshiaki ID: 9000402013143

    Articles in CiNii:1

    • Accurate Complex Refractive Index with Standard Deviation of ZnTe Measured by Terahertz Time Domain Spectroscopy (2013)
  • Asahi Toshiaki ID: 9000402019924

    Articles in CiNii:1

    • Molecular beam epitaxy growth and pole figure analysis of ZnTe epilayer onm-plane sapphire (2013)
  • Asahi Toshiaki ID: 9000402038222

    Articles in CiNii:1

    • Propagation loss reduction of ZnMgTe/ZnTe waveguide devices (2016)
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