Search Results1-13 of  13

  • AWAJI Mitsuhiro ID: 9000000788675

    National Research Institute for Metals (1996 from CiNii)

    Articles in CiNii:1

    • Practical Performance of Energy-Dispersive X-Ray Spectroscopy with a High-Voltage TEM up to 1,000kV (1996)
  • AWAJI Mitsuhiro ID: 9000020103611

    Japan Synchrotron Radiation Research Institute (SPring-8) (2001 from CiNii)

    Articles in CiNii:1

    • サマリー・アブストラクト (2001)
  • AWAJI Mitsuhiro ID: 9000107353183

    Japan Synchrotron Radiation Research Institute (2001 from CiNii)

    Articles in CiNii:1

    • Suppression of Corrugated Boundaries in Multilayer Fresnel Zone Plate for Hard X-Ray Synchrotron Radiation Using Cylindrical Slit (2001)
  • AWAJI Mitsuhiro ID: 9000350572854

    株式会社神戸製鋼所神戸工場 (1965 from CiNii)

    Articles in CiNii:1

    • パネル討論会報告 (1965)
  • AWAJI Mitsuhiro ID: 9000350628141

    神戸製鋼所, 神戸工場 (1964 from CiNii)

    Articles in CiNii:1

    • パネル討論会 (1964)
  • Awaji Mitsuhiro ID: 9000003381460

    NRIM (1996 from CiNii)

    Articles in CiNii:2

    • Crystal structure analysis of precipitated Xe atom clusters in Al (1996)
    • Observation of point defects in a Si(110)single crystal by 400kV HRTEM (1996)
  • Awaji Mitsuhiro ID: 9000252972899

    Okayama University of Science (1990 from CiNii)

    Articles in CiNii:1

    • Surface Topography of Ion-Etched Si Wafers Studied by Electron Microscopy (1990)
  • Awaji Mitsuhiro ID: 9000258157642

    Japan Synchrotron Radiation Research Institute, SPring-8, 1-1-1 Kouto, Mikazuki, Sayo-gun, Hyogo 679-5198, Japan (2001 from CiNii)

    Articles in CiNii:1

    • Suppression of Corrugated Boundaries in Multilayer Fresnel Zone Plate for Hard X-Ray Synchrotron Sadiation Using Cylindrical Slit. (2001)
  • Awaji Mitsuhiro ID: 9000258198147

    JASRI/SPring-8 (2004 from CiNii)

    Articles in CiNii:1

    • Hard X-ray Photoemission Spectroscopy of Temperature-Induced Valence Transition in EuNi2(Si0.20Ge0.80)2 (2004)
  • Awaji Mitsuhiro ID: 9000392718230

    Articles in CiNii:1

    • Surface Topography of Ion-Etched Si Wafers Studied by Electron Microscopy (1990)
  • Awaji Mitsuhiro ID: 9000401618052

    Articles in CiNii:1

    • Surface Topography of Ion-Etched Si Wafers Studied by Electron Microscopy (1990)
  • Awaji Mitsuhiro ID: 9000401699912

    Articles in CiNii:1

    • Suppression of Corrugated Boundaries in Multilayer Fresnel Zone Plate for Hard X-Ray Synchrotron Radiation Using Cylindrical Slit (2001)
  • Awaji Mitsuhiro ID: 9000401892992

    JASRI/SPring-8, Mikazuki-cho, Sayo-gun, Hyogo 679-5148 (2004 from CiNii)

    Articles in CiNii:1

    • Hard X-ray Photoemission Spectroscopy of Temperature-Induced Valence Transition in EuNi2(Si0.20Ge0.80)2 (2004)
Page Top