Search Results1-2 of  2

  • AHN Seung Eun ID: 9000001673516

    Samsung Advanced Institute of Technology (2005 from CiNii)

    Articles in CiNii:1

    • Study of Transport and Dielectric of Resistive Memory States in NiO Thin Film (2005)
  • Ahn Seung Eun ID: 9000401743386

    Articles in CiNii:1

    • Study of Transport and Dielectric of Resistive Memory States in NiO Thin Film (2005)
Page Top