Search Results1-20 of  23

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  • Asai Hidehiro ID: 9000403865728

    Articles in CiNii:1

    • Three-dimensional numerical analysis of terahertz radiation emitted from intrinsic Josephson junctions with hot spots (2012)
  • Asai Hidehiro ID: 9000403868114

    Articles in CiNii:1

    • Proposal of terahertz patch antenna fed by intrinsic Josephson junctions (2012)
  • Asai Hidehiro ID: 9000403868841

    Articles in CiNii:1

    • An analysis of three dimensional radiation patterns from intrinsic Josephson junctions with hot spot (2013)
  • ASAI Hidehiro ID: 9000016378070

    Department of Materials Engineering, The University of Tokyo (2009 from CiNii)

    Articles in CiNii:1

    • Numerical Analysis of Superconducting Current Injected from Quasi One Dimensional Leads into Mesoscopic Samples (2009)
  • Asai Hidehiro ID: 9000006845380

    AIST (2015 from CiNii)

    Articles in CiNii:22

    • 21aPS-136 Vortex dynamics simulation in high-T_c superconductors with planar pinning arrays II (2008)
    • 19aPS-16 Molecular dynamics simulation of vortex dynamics with twin boundaries II (2007)
    • 24aWF-2 Vortex dynamics and critical currents in superconductors with twin boundaries (2007)
  • Asai Hidehiro ID: 9000388519021

    AIST (2017 from CiNii)

    Articles in CiNii:1

    • Theory on thermal manipulation of terahertz radiation from intrinsic Josephson junctions of high-Tc superconductors (2017)
  • Asai Hidehiro ID: 9000401566464

    Articles in CiNii:1

    • Numerical Analysis of Superconducting Current Injected from Quasi One Dimensional Leads into Mesoscopic Samples (2009)
  • Asai Hidehiro ID: 9000401802505

    Articles in CiNii:1

    • High Temperature Superconductor Terahertz Emitters: Fundamental Physics and Its Applications (2011)
  • Asai Hidehiro ID: 9000401978180

    Articles in CiNii:1

    • A time-dependent Verilog-A compact model for MOS capacitors with interface traps (2019)
  • Asai Hidehiro ID: 9000402003369

    Articles in CiNii:1

    • High Temperature Superconductor Terahertz Emitters: Fundamental Physics and Its Applications (2012)
  • Asai Hidehiro ID: 9000402041186

    Articles in CiNii:1

    • Suppression of tunneling rate fluctuations in tunnel field-effect transistors by enhancing tunneling probability (2017)
  • Asai Hidehiro ID: 9000402041205

    Articles in CiNii:1

    • On the drain bias dependence of long-channel silicon-on-insulator-based tunnel field-effect transistors (2017)
  • Asai Hidehiro ID: 9000402041321

    Articles in CiNii:1

    • 2017-03-10 (2017)
  • Asai Hidehiro ID: 9000402047571

    Articles in CiNii:1

    • Process and device integration for silicon tunnel FETs utilizing isoelectronic trap technology to enhance the ON current (2018)
  • Asai Hidehiro ID: 9000402047741

    Articles in CiNii:1

    • Design of steep-slope negative-capacitance FinFETs for dense integration: Importance of appropriate ferroelectric capacitance and short-channel effects (2018)
  • Asai Hidehiro ID: 9000402047747

    Articles in CiNii:1

    • Simulation study of short-channel effects of tunnel field-effect transistors (2018)
  • Asai Hidehiro ID: 9000402047771

    Articles in CiNii:1

    • Fringing field effects in negative capacitance field-effect transistors with a ferroelectric gate insulator (2018)
  • Asai Hidehiro ID: 9000402047800

    Articles in CiNii:1

    • Enhancement of capacitance benefit by drain offset structure in tunnel field-effect transistor circuit speed associated with tunneling probability increase (2018)
  • Asai Hidehiro ID: 9000402047993

    Articles in CiNii:1

    • 2018-02-20 (2018)
  • Asai Hidehiro ID: 9000402238054

    Articles in CiNii:1

    • 2019-04-01 (2019)
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