Search Results1-4 of  4

  • BAEK Seong Hak ID: 9000107388994

    System IC R&D Division, Hynix Semiconductor Inc. (2004 from CiNii)

    Articles in CiNii:1

    • Gate Engineering to Prevent NMOS Dopant Channeling for Nanoscale CMOSFET Technology (2004)
  • BAEK Seong-Hak ID: 9000107344391

    MagnaChip Semiconductor Ltd. (2005 from CiNii)

    Articles in CiNii:1

    • Dependence of Analog and Digital Performances on Mechanical Film Stress of ILD Layers in Nanoscale CMOSFETs (2005)
  • Baek Seong-Hak ID: 9000258180472

    MagnaChip Semiconductor Ltd. (2005 from CiNii)

    Articles in CiNii:1

    • Dependence of Analog and Digital Performances on Mechanical Film Stress of ILD Layers in Nanoscale CMOSFETs (2005)
  • Baek Seong-Hak ID: 9000401735524

    Articles in CiNii:1

    • Dependence of Analog and Digital Performances on Mechanical Film Stress of ILD Layers in Nanoscale CMOSFETs (2005)
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